VOL. 24 · NO. 9 | September 2009
 
IN THIS ISSUE

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PALAIOS
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Loïc Villier
PALAIOS 24 (9), 551-552, (1 September 2009) https://doi.org/10.2110/palo.2009.S05
No abstract available
Research Articles
Katerina Vasileiadou, Jerry J Hooker, Margaret E Collinson
PALAIOS 24 (9), 553-567, (1 September 2009) https://doi.org/10.2110/palo.2008.P08-035r
Michał Zatoń, Grzegorz Niedźwiedzki, Grzegorz Pieńkowski
PALAIOS 24 (9), 568-577, (1 September 2009) https://doi.org/10.2110/palo.2009.p09-005r
Benjamin F Dattilo, David L Meyer, Keith Dewing, Matthew R Gaynor
PALAIOS 24 (9), 578-590, (1 September 2009) https://doi.org/10.2110/palo.2008.p08-102r
Jason R Moore, David B Norman
PALAIOS 24 (9), 591-602, (1 September 2009) https://doi.org/10.2110/palo.2008.p08-135r
Thomas L Adams
PALAIOS 24 (9), 603-615, (1 September 2009) https://doi.org/10.2110/palo.2009.p09-010r
James D Schiffbauer, Shuhai Xiao
PALAIOS 24 (9), 616-626, (1 September 2009) https://doi.org/10.2110/palo.2009.p09-003r
KEYWORDS: focused ion beam electron microscopy, nanotomography, sequential ion sectioning, acritarch, ultrastructure
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