X-Band Rapid-Scan Electron Paramagnetic Resonance of Radiation-Induced Defects in Tooth Enamel

Zhelin Yu; Alexander Romanyukha; Sandra S. Eaton; Gareth R. Eaton

doi:10.1667/RR14032.1.1

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Zhelin Yu,¹ Alexander Romanyukha,² Sandra S. Eaton,¹ Gareth R. Eaton^1,*

¹a Department of Chemistry and Biochemistry, University of Denver, Denver, Colorado 80208; and
²b Naval Dosimetry Center, Bethesda, Maryland 20889

^*Address for correspondence: Department of Chemistry and Biochemistry, University of Denver, 2101 E. Wesley Ave., Denver, CO 80210; e-mail: geaton@du.edu.

Abstract

X-band rapid-scan electron paramagnetic resonance (EPR) spectra from tooth enamel samples irradiated with doses of 0.5, 1 and 10 Gy had substantially improved signal-to-noise relative to conventional continuous wave EPR. The radiation-induced signal in a 60 mg of a tooth enamel sample irradiated with a 0.5 Gy dose was readily characterized in spectra recorded with 34 min data acquisition times. The coefficient of variance of the calculated dose for a 1 Gy irradiated sample, based on simulation of the first-derivative spectra for three replicates as the sum of native and radiation-induced signals, was 3.9% for continuous wave and 0.4% for rapid scan.

Citation Download Citation

Zhelin Yu, Alexander Romanyukha, Sandra S. Eaton, and Gareth R. Eaton "X-Band Rapid-Scan Electron Paramagnetic Resonance of Radiation-Induced Defects in Tooth Enamel," Radiation Research 184(2), 175-179, (24 July 2015). https://doi.org/10.1667/RR14032.1.1

Received: 28 January 2015; Accepted: 1 May 2015; Published: 24 July 2015

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